Statistics

Industrial Statistics

Systems Reliability

1. Guan Zhao-Zhi Youth Researcher Awards 2014, Institute of Systems Science, AMSS, CAS

2. ICRMS2022 Best Paper Awards：Qifang Liu, Qingpei Hu, Dan Yu (2022). Photovoltaic system degradation modeling under dynamic environmental profiles, Hong Kong, China

3. IISE Transactions 2020 Best Paper Normination： Li, Z. H., Yu, D., Liu, J. and Hu, Q.P. (2020), “Higher-order normal approximation approach for highly reliable system assessment.” IISE Transactions, 52 (5), 555-567

4. Featured Article of IISE Transactions： Li, Z. H., Yu, D., Liu, J. and Hu, Q.P. (2020), “Higher-order normal approximation approach for highly reliable system assessment.” IISE Transactions, 52 (5), 555-567

5. Best Student Paper of IRC-SEMS2019：Wang, C. J., Hu, Q. P., and Yu, D. (2019). "Assessment of Reliability for Accelerated Degradation Testing with Random Initial Degradation." The 7th International Research Conference on Systems Engineering and Management Science. Nanjing, pp. 1-6. (Supervisor)

6. Best Paper Award of NRPS2019：Zan Li, F.M. Wang, C.J. Wang, Q.P. Hu, D. Yu，"Reliability Evaluation based on Life Time Delayed Degradation Process"，National Reliability Physics Symposium of China, 2019, Guilin

7. Best Paper Awards of QR2MSE2018：Li, D.M., Q. P. Hu, and D. Yu, Likelihood based Statistical Inference Approach for Mt/G/Inf Queueing Systems Under Incomplete Observations, in 2018 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, Qingdao.  

8. Best Student Paper Awards of IRC-SEMS2018：Li, D.M., Q. P. Hu, and D. Yu, Likelihood based Statistical Inference Approach for Mt/G/Inf Queueing Systems Under Incomplete Observations, in the 6th International Research Conference on Systems Engineering and Management Science. 2018. (Supervisor)

9. Best Paper Awards of ICRMS2016：Li, Z., Q.P. Hu and D. Yu (2016). A Normal Approximation Approach with Higher Order for System Reliability Assessment. 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Hangzhou, China.

10. Featured Article of IISE Transactions：Wang, L., Q.P. Hu and J. Liu (2016). Software reliability growth modeling and analysis with dual fault detection and correction processes. IIE Transactions 48(4): 359-370. (SCI)

11. Best Student Paper of PRDC2006：Hu, Q. P, Xie, M., and Ng, S. h. (2006). "Early Software Reliability Prediction with ANN Models" 12th Pacific Rim International Symposium on Dependable Computing (PRDC'06). Riverside, 210-220.

1. 陈思懿，曹智胜，胡庆培，谢旻，(2024), "加速退化试验可靠性评估的两步法与一步法比较研究", 系统工程理论与实践 （录用）

2. Pei-ran Ye, Xiong-bo Yan, Zhe Ning, Jun Hu, Wei Wei, Xiao-shan Jiang, Ru-yi Jin, Yun-hua Sun, Qing-pei Hu, Yu-sheng Wang, Mu-jin Li, 2024, 

3. Reliability studies of the custom-designed front-end and ADC chips used for JUNO large photomultipliers electronics. Radiat Detect Technol Methods 8, 1239–124

4. Yixiao Ruan, Zan Li, Zhaohui Li*, Dennis K. J. Lin, Qingpei Hu, Dan Yu, (2024), “Novel Subsampling Strategies for Heavily Censored Reliability Data”, Statistics and Its Interface (Accepted)

5. Q.F. Liu, J. Lu, H.K. Ng, Q.P. Hu*, D. Yu,  (2024) "Multivariate t degradation processes for dependent multivariate degradation data",  IEEE Transactions on Reliability , (Online)
   

6. S.Y. Chen, Z.T. Lu*, Q.P. Hu, M. Xie, D. Yu, (2023) "Bayesian Analysis of Lifetime Delayed Degradation Process for Destructive/Nondestructive Inspection",  IEEE Transactions on Reliability (Online)

7. Q.F. Liu, Q.P. Hu*, J.F. Zhou, D. Yu, H.D. Mo, (2023), "Remaining Useful Life Prediction of PV Systems Under Dynamic Environmental Profiles", IEEE Journal of Photovoltaics, 13(4), 590-602

8. Z. Li, H. K. T. Ng*, D. Yu and Q.P. Hu, (2023), "Optimal Acceptance Sampling Testing Plan With Pivotal Quantity for Log-Location-Scale Distributions," IEEE Transactions on Reliability (Online)

9. Wang, C.J., Liu J., Yang, Q.Y., Hu, Q.P.*, Yu, D. (2023), "Recoverability Effects on Reliability Assessment for Accelerated Degradation Testing", IISE Transactions, 55(7), 698-710

10. Fan, Z.Y., Li, Z.H.*, Hu, Q.P.* (2022), "Robust Bayesian Regression via Hard Threshold", NeurIPS2022, 1-24

11. Li, Z., Hu, Q.P.*, Yang, Q.Y., Yu, D. (2021), “Statistical Analysis and Optimal Inspection Planning for Lifetime Delayed Gamma Degradation Process”, Quality and Reliability Engineering International, 1-16

12. Li, Z., Wang, F.M., Wang, C.J., Hu, Q.P.*, Yu, D. (2021), “Reliability Modeling and Evaluation of Lifetime Delayed Degradation Process with Nondestructive Testing,” Reliability Engineering & System Safety, 208, 1-11 

13.  Li, Z. H., Yu, D., Liu, J. and Hu, Q.P.* (2020), “Higher-order normal approximation approach for highly reliable system assessment.” IISE Transactions, 52 (5), 555-567. (Featured Article / Best Paper Nomination for IISE Transactions 2020) 

14. Li, D. M., Hu, Q.P.*, Wang, L. J. , and Yu, D. (2019), “Statistical Inference for Mt/G/Infinity Queueing Systems Under Incomplete Observations.”, European Journal of Operational Research, 279, 882-901

15. Ye, Z. S., Hu, Q. P.*, and Yu, D. (2019). "Strategic allocation of test units in an accelerated degradation test plan." Journal of Quality Technology, 51(1), 64-80. 

16. Sheng, Z., Hu, Q. P.*, Liu, J., and Yu, D. (2019). "Residual life prediction for complex systems with multi-phase degradation by ARMA-filtered hidden Markov model." Quality Technology & Quantitative Management, 16(1), 19-35.

17. Wang, L., Hu, Q. P.*, and Liu, J. (2016). "Software reliability growth modeling and analysis with dual fault detection and correction processes." IIE Transactions, 48(4), 359-370. (Featured Article) 

18. Hu, Q. P.*, Xie, M., Ng, S. H., and Levitin, G. (2007). "Robust recurrent neural network modeling for software fault detection and correction prediction." Reliability Engineering & System Safety, 92(3), 332-340.

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