基本信息
俞文杰  男  博导  中国科学院上海微系统与信息技术研究所
电子邮件: casan@mail.sim.ac.cn
通信地址: 上海市长宁路865号5号楼709室
邮政编码: 200050

招生信息

   
招生专业
080903-微电子学与固体电子学
招生方向
先进SOI材料,SOI高迁移率器件,SOI抗辐照器件,集成电路材料基因组

教育背景

2009-09--2011-06   德国于利希研究中心(Forschungszentrum Juelich)   联合培养博士生
2005-09--2011-06   中国科学院上海微系统与信息技术研究所   研究生/博士
2001-09--2005-06   复旦大学   本科/学士

工作经历

   
工作简历
2011-06~现在, 中国科学院上海微系统与信息技术研究所, 助理研究员、副研究员、研究员
2011-06~2011-08,德国于利希研究中心(Forschungszentrum Juelich), 访问学者

专利与奖励

   
专利成果
( 1 ) 利用离子注入释放单晶氮化铝应力的方法, 发明专利, 2022, 第 3 作者, 专利号: CN202210146662

( 2 ) 三维堆叠的环栅晶体管的制备方法, 发明专利, 2022, 第 2 作者, 专利号: CN111435643B

( 3 ) 高通量薄膜沉积设备及薄膜沉积方法, 发明专利, 2021, 第 2 作者, 专利号: CN113862625A

( 4 ) 基于隧穿隔离层的磁性隧穿结器件及其制作方法, 发明专利, 2021, 第 2 作者, 专利号: CN111293212B

( 5 ) 改善自热效应的SOI器件及其制备方法, 发明专利, 2021, 第 2 作者, 专利号: CN111986996B

( 6 ) 真空沟道晶体管及其制备方法, 发明专利, 2021, 第 3 作者, 专利号: CN113594004A

( 7 ) 真空沟道晶体管及其制作方法, 发明专利, 2021, 第 3 作者, 专利号: CN113594006A

( 8 ) 全环绕栅极晶体管的制备方法, 发明专利, 2021, 第 3 作者, 专利号: CN113539792A

( 9 ) 环栅晶体管的制备方法, 发明专利, 2021, 第 2 作者, 专利号: CN111435678B

( 10 ) 减少侧边漏电的SOI场效应晶体管及其制备方法, 发明专利, 2021, 第 2 作者, 专利号: CN111952182B

( 11 ) 基于SOI衬底的热光相移器的制备方法, 发明专利, 2021, 第 2 作者, 专利号: CN112305785A

( 12 ) 具有空腔结构的半导体衬底及其制备方法, 发明专利, 2020, 第 1 作者, 专利号: CN111952239A

( 13 ) 具有辅助支撑结构的半导体衬底及其制备方法, 发明专利, 2020, 第 1 作者, 专利号: CN111952241A

( 14 ) 基于空腔包围结构的场效应晶体管及制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952186A

( 15 ) 具有纳米级空腔结构的SOI衬底及其制备方法, 发明专利, 2020, 第 1 作者, 专利号: CN111952240A

( 16 ) 基于图形化埋层介质层的环栅场效应晶体管的制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952184A

( 17 ) 具有环栅结构的场效应晶体管的制备方法, 发明专利, 2020, 第 1 作者, 专利号: CN111952183A

( 18 ) 具有空腔结构的SOI衬底及其制备方法, 发明专利, 2020, 第 1 作者, 专利号: CN111952238A

( 19 ) 具有隔离层的场效应晶体管及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952188A

( 20 ) 可降低对准难度的SOI器件及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952185A

( 21 ) 具有隔离层的鳍式场效应晶体管及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952181A

( 22 ) 具有漏电屏蔽结构的SOI场效应晶体管及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952187A

( 23 ) 基于空腔包围结构的环形栅场效应晶体管及制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111952189A

( 24 ) 图形化结构的SOI衬底的制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435637A

( 25 ) 基于图形化SOI衬底的半导体纳米线结构及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435649A

( 26 ) 多通道环栅晶体管, 发明专利, 2020, 第 2 作者, 专利号: CN111435682A

( 27 ) 环栅晶体管及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435644A

( 28 ) 三维堆叠的半导体纳米线结构及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435642A

( 29 ) 三维堆叠的环栅晶体管及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435641A

( 30 ) 图形化结构的SOI衬底及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: CN111435666A

( 31 ) 基于二维器件的三维MRAM存储结构及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293136A

( 32 ) 基于二维CMOS的三维MRAM存储结构及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293137A

( 33 ) 三维MRAM存储结构及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293138A

( 34 ) 基于柔性衬底的磁性隧穿结器件及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293214A

( 35 ) 基于二维自由磁层的磁性隧穿结器件及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293215A

( 36 ) 基于二维材料的磁性隧穿结器件及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293213A

( 37 ) 磁性隧穿结器件及其制作方法, 发明专利, 2020, 第 2 作者, 专利号: CN111293216A

( 38 ) 高通量气相沉积设备及气相沉积方法, 专利授权, 2019, 第 2 作者, 专利号: CN110408910A

( 39 ) 基于图形化SOI衬底的抗辐照晶体管及其制作方法, 专利授权, 2019, 第 2 作者, 专利号: CN109935628A

( 40 ) 一种图形化绝缘体上硅衬底材料及其制备方法, 发明专利, 2018, 第 1 作者, 专利号: CN105895575B

( 41 ) 场效应晶体管结构及其制备方法, 发明专利, 2018, 第 4 作者, 专利号: CN107871780A

( 42 ) 利用可控缺陷石墨烯插入层制备金属-半导体合金的方法, 专利授权, 2017, 第 3 作者, 专利号: CN106711019A

( 43 ) SiGeSn材料及其制备方法, 专利授权, 2017, 第 3 作者, 专利号: CN106328502A

( 44 ) 基于绝缘体上硅衬底的射频共面波导元件及其制备方法, 专利授权, 2016, 第 1 作者, 专利号: CN105914445A

( 45 ) 基于绝缘体上硅衬底的射频电容元件及其制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105895507A

( 46 ) 用于射频与CMOS电路共集成的绝缘体上硅衬底及制备方法, 专利授权, 2016, 第 1 作者, 专利号: CN105810694A

( 47 ) 基于绝缘体上硅衬底的射频电感元件及其制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105789189A

( 48 ) 一种绝缘体岛上硅衬底材料及其制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105633001A

( 49 ) 一种基于绝缘体岛上硅衬底的CMOS器件结构及制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105633084A

( 50 ) 一种图形化绝缘体上硅衬底材料及其制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105633002A

( 51 ) 一种绝缘体岛上硅衬底材料及其制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105552019A

( 52 ) 一种图形化绝缘体上Si/NiSi2衬底材料及其制备方法, 发明专利, 2016, 第 2 作者, 专利号: CN103137538B

( 53 ) 一种基于图形化绝缘体上硅衬底的CMOS器件结构及制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105428358A

( 54 ) 一种基于绝缘体岛上硅衬底的CMOS器件结构及制备方法, 发明专利, 2016, 第 1 作者, 专利号: CN105390495A

( 55 ) 基于sSi/SiGe/sSOI衬底的CMOS器件及其制作方法, 发明专利, 2015, 第 4 作者, 专利号: CN105097846A

( 56 ) 基于Si/SiGe/Si量子阱MOSFET的生物传感器及其制备方法, 发明专利, 2015, 第 2 作者, 专利号: CN104730111A

( 57 ) 基于超薄绝缘层SOI上的MOSFET背栅生物传感器及其制备方法, 发明专利, 2015, 第 2 作者, 专利号: CN104730137A

( 58 ) 基于sSOI MOSFET的生物传感器及其制备方法, 发明专利, 2015, 第 2 作者, 专利号: CN104713931A

( 59 ) 一种基于硅纳米线隧穿场效应晶体管的生物传感器及其制备方法, 发明专利, 2014, 第 1 作者, 专利号: CN103558279A

( 60 ) 一种基于隧穿场效应晶体管的生物传感器及其制备方法, 发明专利, 2014, 第 1 作者, 专利号: CN103558280A

( 61 ) 一种垂直结构的隧穿场效应晶体管及其制备方法, 发明专利, 2014, 第 2 作者, 专利号: CN103560152A

( 62 ) 一种隧穿场效应晶体管及其制备方法, 发明专利, 2014, 第 2 作者, 专利号: CN103560153A

( 63 ) 一种基于垂直结构隧穿场效应晶体管的生物传感器及其制备方法, 发明专利, 2014, 第 2 作者, 专利号: CN103558254A

( 64 ) 一种图形化全耗尽绝缘体上Si/NiSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137546A

( 65 ) 一种绝缘体上Si/NiSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137547A

( 66 ) 一种绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 2 作者, 专利号: CN103137539A

( 67 ) 一种绝缘体上Si/NiSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137547A

( 68 ) 一种绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 2 作者, 专利号: CN103137539A

( 69 ) 一种图形化全耗尽绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 2 作者, 专利号: CN103137537A

( 70 ) 一种图形化全耗尽绝缘体上Si/NiSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137546A

( 71 ) 一种图形化绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137565A

( 72 ) 一种图形化全耗尽绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 2 作者, 专利号: CN103137537A

( 73 ) 一种图形化绝缘体上Si/NiSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 2 作者, 专利号: CN103137538A

( 74 ) 一种图形化绝缘体上Si/CoSi 2 衬底材料及其制备方法, 发明专利, 2013, 第 1 作者, 专利号: CN103137565A

出版信息

   
发表论文
[1] Jiang, Wenzheng, Zhu, Lei, Chen, Lingli, Yang, Yumeng, Yu, Xi, Li, Xiaolong, Mu, Zhiqiang, Yu, Wenjie. In Situ Synchrotron XRD Characterization of Piezoelectric Al1-xScxN Thin Films for MEMS Applications. MATERIALS[J]. 2023, 16(5): http://dx.doi.org/10.3390/ma16051781.
[2] Mu, Zhiqiang, Zhou, Hongyang, Yang, Yumeng, Liu, Qiang, Wei, Xing, Yu, Wenjie. Junctionless nanosheet gate-all-around transistors fabricated on void embedded silicon on insulator substrate. ELECTRONICS LETTERS[J]. 2023, 59(4): http://dx.doi.org/10.1049/ell2.12740.
[3] 朱宇波, 母志强, 陈玲丽, 朱雷, 李卫民, 俞文杰. 掺钪AlN材料特性及HBAR器件性能研究. 压电与声光[J]. 2022, 44(2): 299-303, http://lib.cqvip.com/Qikan/Article/Detail?id=7107129145.
[4] Liu, Xinke, Hu, Shengqun, Lin, Zhichen, Li, Xiaohua, Song, Lijun, Yu, Wenjie, Wang, Qi, He, Wei. High-Performance MoS2 Photodetectors Prepared Using a Patterned Gallium Nitride Substrate. ACS APPLIED MATERIALS & INTERFACES[J]. 2021, 13(13): 15820-15826, http://dx.doi.org/10.1021/acsami.0c22799.
[5] Liu, Xinke, Hu, Shengqun, Luo, Jiangliu, Li, Xiaohua, Wu, Jing, Chi, Dongzhi, Ang, KahWee, Yu, Wenjie, Cai, Yongqing. Suspended MoS2 Photodetector Using Patterned Sapphire Substrate. SMALL[J]. 2021, 17(43): http://dx.doi.org/10.1002/smll.202100246.
[6] 陈玲丽, 刘畅, 刘强, 赵兰天, 刘晨鹤, 朱宇波, 俞文杰. 基于杂质分凝技术的隧穿场效应晶体管电流镜. 半导体技术[J]. 2021, 46(5): 365-369+401, http://lib.cqvip.com/Qikan/Article/Detail?id=7104818797.
[7] Ren, Qinghua, Xu, Wenhui, Shen, Zhenghao, You, Tiangui, Liu, Qiang, Liu, Chenhe, Zhao, Lantian, Chen, Lingli, Yu, Wenjie. Solar-Blind Photodetector Based on Single Crystal Ga2O3 Film Prepared by a Unique Ion-Cutting Process. ACS APPLIED ELECTRONIC MATERIALS[J]. 2021, 3(1): 451-460, http://dx.doi.org/10.1021/acsaelm.0c00990.
[8] Yang, Jun, Ping, Yunxia, Liu, Wei, Yu, Wenjie, Xue, Zhongying, Wei, Xing, Wu, Aimin, Zhang, Bo. Ti Interlayer Mediated Uniform NiGe Formation under Low-Temperature Microwave Annealing. METALS[J]. 2021, 11(3): https://doaj.org/article/6dfc622632d14e639c0b7a8c3169d34e.
[9] Liu, Qiang, Mu, Zhiqiang, Liu, Chenhe, Zhao, Lantian, Chen, Lingli, Yang, Yumeng, Wei, Xing, Yu, Wenjie. Gate-All-Around MOSFET Built on Void Embedded Silicon on Insulator Substrate. IEEE ELECTRON DEVICE LETTERS[J]. 2021, 42(5): 657-660, http://dx.doi.org/10.1109/LED.2021.3066171.
[10] Ben, Jianwei, Liu, Xinke, Wang, Cong, Zhang, Yupeng, Shi, Zhiming, Jia, Yuping, Zhang, Shanli, Zhang, Han, Yu, Wenjie, Li, Dabing, Sun, Xiaojuan. 2D III-Nitride Materials: Properties, Growth, and Applications. ADVANCED MATERIALSnull. 2021, 33(27): http://dx.doi.org/10.1002/adma.202006761.
[11] Liu, Xinke, Luo, Jiangliu, Zhu, DeLiang, Lu, You Ming, Li, Xiaohua, He, Jinlan, Chiu, HsienChin, Xu, Ke, Yu, Wenjie, Chung, RenJei. Monolithic Integration of Strained UV-Visible Dual Color Photodetectors on 4 in. Multilayer MoS2-on-Freestanding GaN Wafer by Direct van der Waals Growth. ACS APPLIED ELECTRONIC MATERIALS[J]. 2021, 3(5): 1988-1995, http://dx.doi.org/10.1021/acsaelm.0c01092.
[12] Liu Wei, Ping YunXia, Yang Jun, Xue ZhongYing, Wei Xing, Wu AiMin, Yu WenJie, Zhang Bo. Reaction of titanium-modulated nickel with germanium-tin under microwave and rapid thermal annealing. ACTA PHYSICA SINICA[J]. 2021, 70(11): [13] Zhao, Lantian, Liu, Qiang, Liu, Chenhe, Chen, Lingli, Yang, Yumeng, Wei, Xing, Mu, Zhiqiang, Yu, Wenjie. Total Ionizing Dose Effects on Nanosheet Gate-All-Around MOSFETs Built on Void Embedded Silicon on Insulator Substrate. IEEE ELECTRON DEVICE LETTERS[J]. 2021, 42(10): 1428-1431, http://apps.webofknowledge.com/CitedFullRecord.do?product=UA&colName=WOS&SID=5CCFccWmJJRAuMzNPjj&search_mode=CitedFullRecord&isickref=WOS:000701249800008.
[14] Liu, Xinke, Deng, Xuanhua, Li, Xiaohua, Chiu, HsienChin, Chen, Yuxuan, Botcha, V Divakar, Wang, Min, Yu, Wenjie, Lin, ChiaHan. Impact of Al2O3 stress liner on two-dimensional SnS2 nanosheet for photodetector application. JOURNAL OF ALLOYS AND COMPOUNDS[J]. 2020, 830: http://dx.doi.org/10.1016/j.jallcom.2020.154716.
[15] Zhao, LanTian, Liu, Mingshan, Ren, QingHua, Liu, ChenHe, Liu, Qiang, Chen, LingLi, Spiegel, Yohann, Torregrosa, Frank, Yu, Wenjie, Zhao, QingTai. Phase evolution of ultra-thin Ni silicide films on CF4 plasma immersion ion implanted Si. NANOTECHNOLOGY[J]. 2020, 31(20): https://www.webofscience.com/wos/woscc/full-record/WOS:000518668500001.
[16] Yong, Kai, Ping, Yunxia, Liu, Wei, Yang, Jun, Yu, Wenjie, Xue, Zhongying, Wei, Xing, Wu, Aimin, Zhang, Bo. Formation of uniform and homogeneous ternary NiSi2-xAlx on Si(001) by an Al interlayer mediation. APPLIED PHYSICS EXPRESS[J]. 2020, 13(1): https://www.webofscience.com/wos/woscc/full-record/WOS:000522360600001.
[17] Li, Zhiwen, Luo, Jiangliu, Hu, Shengqun, Liu, Qiang, Yu, Wenjie, Lu, Youming, Liu, Xinke. Strain enhancement for a MoS2-on-GaN photodetector with an Al2O3 stress liner grown by atomic layer deposition. PHOTONICS RESEARCH[J]. 2020, 8(6): 799-805, http://lib.cqvip.com/Qikan/Article/Detail?id=7102332502.
[18] Li Zhiwen, Wu Jing, Wang Cong, Zhang Han, Yu Wenjie, Lu Youming, Liu Xinke. High-performance monolayer MoS2 photodetector enabled by oxide stress liner using scalable chemical vapor growth method. NANOPHOTONICS[J]. 2020, 9(7): 1981-1991, https://doaj.org/article/3a8329e7338b40d6937639da39b9866e.
[19] Zou, Muyuan, Chu, Jianan, Zhang, Hui, Yuan, Tianzhong, Cheng, Peng, Jin, Wentao, Jiang, Da, Xu, Xuguang, Yu, Wenjie, An, Zhenghua, Wei, Xinyuan, Mu, Gang, Li, Wei. Evidence for ferromagnetic order in the CoSb layer of LaCoSb2. PHYSICAL REVIEW B[J]. 2020, 101(15): https://www.webofscience.com/wos/woscc/full-record/WOS:000528780500006.
[20] Li, Jiaofu, Wang, Cong, Zhang, Bin, Wang, Zhenhong, Yu, Wenjie, Chen, Yong, Liu, Xinke, Guo, Zhongyi, Zhang, Han. Artificial Carbon Graphdiyne: Status and Challenges in Nonlinear Photonic and Optoelectronic Applications. ACS APPLIED MATERIALS & INTERFACESnull. 2020, 12(44): 49281-49296, https://www.webofscience.com/wos/woscc/full-record/WOS:000589384100002.
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[85] Wenjie Yu. High Voltage AlGaN/GaN Metal-Oxide-Semiconductor High-Electron Mobility Transistors with RegrownIn0.14Ga0.86N Contact Using a Complementary Metal-Oxide-Semiconductor Compatible Gold-Free Process. Applied Physics Express. 2014, [86] Yu Wenjie, Zhang Bo, Liu Chang, Xue Zhongying, Chen Ming, Zhao Qingtai. Mobility Enhancement and Gate-Induced-Drain-Leakage Analysis of Strained-SiGe Channel p-MOSFETs with Higher-k LaLuO_3 Gate Dielectric. CHINESE PHYSICS LETTERS[J]. 2014, 31(1): 016101-1, http://sciencechina.cn/gw.jsp?action=detail.jsp&internal_id=5063275&detailType=1.
[87] 张波, 俞文杰, 薛忠营, 魏星. C~+离子注入SiGe衬底提高NiSiGe表面和界面特性研究. 功能材料与器件学报[J]. 2013, 19(4): 202-207, http://sciencechina.cn/gw.jsp?action=detail.jsp&internal_id=4998262&detailType=1.
[88] 母志强, 俞文杰, 张波, 薛忠营, 陈明. Electrical Characteristics of High Mobility Si/Si0.5Ge0.5/SOI Quantum-Well p-MOSFETs with a Gate Length of 100 nm and an Equivalent Oxide Thickness of 1.1 nm. CHINESE PHYSICS LETTERS[J]. 2013, 30(10): 214-216, https://www.webofscience.com/wos/woscc/full-record/WOS:000326492900054.
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[92] 王茹, 刘张李, 邹世昌, 张正选, 毕大炜, 胡志远, 俞文杰, 陈明. 浮栅存储器的单粒子辐射效应研究进展. 功能材料与器件学报[J]. 2010, 16(5): 407-412, http://lib.cqvip.com/Qikan/Article/Detail?id=35863296.
[93] 毕大炜, 张正选, 张帅, 俞文杰, 陈明. 用Pseudo-MOS晶体管和nMOS晶体管表征SIMOX SOI材料的抗总剂量辐射能力. 第十届全国抗辐射电子学与电磁脉冲学术年会论文集[J]. 2009, http://ir.sim.ac.cn/handle/331004/56044.
[94] 刘张李, 张正选, 毕大炜, 张帅, 田浩, 俞文杰, 陈明, 王茹. 浮栅存储器的总剂量辐射效应研究进展. 第十届全国抗辐射电子学与电磁脉冲学术年会论文集[J]. 2009, http://ir.sim.ac.cn/handle/331004/56062.
[95] 王茹, 张正选, 俞文杰, 田浩, 毕大炜, 张帅, 陈明. 注硅工艺对埋氧层中陷阱电荷的影响. 第十届全国抗辐射电子学与电磁脉冲学术年会论文集[J]. 2009, http://ir.sim.ac.cn/handle/331004/55557.
[96] 田浩, 张正选, 刘张李, 俞文杰, 王茹, 张帅, 毕大炜, 陈明. 应用于抗辐照SRAM的地址转换监控电路的设计. 第十届全国抗辐射电子学与电磁脉冲学术年会论文集[J]. 2009, http://ir.sim.ac.cn/handle/331004/55572.
[97] 俞文杰, 张正选, 田浩, 王茹, 毕大伟, 陈明, 张帅, 刘张李. SOI器件总剂量辐射效应研究进展. 第十届全国抗辐射电子学与电磁脉冲学术年会论文集[J]. 2009, http://ir.sim.ac.cn/handle/331004/56069.
[98] Bi DaWei, Zhang ZhengXuan, Zhang Shuai, Chen Ming, Yu WenJie, Wang Ru, Tian Hao, Liu ZhangLi. Radiation response of pseudo-MOS transistors fabricated in hardened fully-depleted SIMOX SOI wafers. CHINESE PHYSICS C[J]. 2009, 33(10): 866-869, http://lib.cqvip.com/Qikan/Article/Detail?id=31674355.
[99] 田浩, 张正选, 贺威, 俞文杰, 王茹, 陈明. Total dose radiation effects on SOI NMOS transistors with different layouts. 中国物理C英文版[J]. 2008, 32(8): 645-648, http://lib.cqvip.com/Qikan/Article/Detail?id=27755558.
[100] He Wei, Zhang ZhengXuan, Mang EnXia, Yu WenJie, Tian Hao, Wang Xi. Practical considerations in the design of SRAM cells on SOI. MICROELECTRONICS JOURNAL[J]. 2008, 39(12): 1829-1833, http://dx.doi.org/10.1016/j.mejo.2008.03.010.
[101] Tian Hao, Zhang ZhengXuan, He Wei, Yu WenJie, Wang Ru, Chen Ming. Total dose radiation effects on SOINMOS transistors with different layouts. CHINESE PHYSICS C[J]. 2008, 32(8): 645-648, http://lib.cqvip.com/Qikan/Article/Detail?id=27755558.
[102] 俞文杰, 王茹, 张正选, 钱聪, 贺威, 田浩, 陈明. 部分耗尽SOI MOSFET总剂量效应与偏置状态的关系(英文). 高能物理与核物理[J]. 2007, http://ir.sim.ac.cn/handle/331004/51157.
[103] 俞文杰, 张正选, 张恩霞, 钱聪, 贺威, 田浩, 陈明, 王茹. 部分耗尽SOI MOSFET总剂量辐射效应的最恶劣偏置状态. 功能材料与器件学报[J]. 2007, 13(6): 549-553, http://lib.cqvip.com/Qikan/Article/Detail?id=26180560.
[104] 俞文杰, 张正选, 贺威, 田浩, 陈明, 王茹, 毕大炜. 利用硅离子注入提高SOI材料的抗辐射性能(英文). 第六届中国功能材料及其应用学术会议论文集(2)[J]. 2007, http://www.irgrid.ac.cn/handle/1471x/364317.
[105] 田浩, 张正选, 张恩霞, 贺威, 俞文杰, 王茹. SOI NMOS晶体管在高剂量的X射线与^60Coγ射线辐射作用下的背栅阈值电压漂移饱和效应的研究及比对. 功能材料与器件学报[J]. 2007, 13(6): 599-603, http://lib.cqvip.com/Qikan/Article/Detail?id=26180568.
[106] Yu WenJie, Wang, Ru, Zhang ZhengXuan, Qian Cong, He Wei, Tian Hao, Chen Ming. Bias dependence of total dose effect of partially depleted SOI MOSFET. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION[J]. 2007, 31(9): 819-822, http://ir.sim.ac.cn/handle/331004/95136.
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[108] 贺威, 张正选, 田浩, 杨惠, 俞文杰, 王茹, 陈明, 王曦. 注硅对SIMOX材料性能影响的研究. 第六届中国功能材料及其应用学术会议论文集[J]. 2007, http://ir.sim.ac.cn/handle/331004/55510.
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发表著作
(1) 集成电路材料基因组技术, 电子工业出版社, 2021-12, 第 1 作者

科研活动

   
科研项目
( 1 ) 无背栅 SOI MOS 器件研制及其抗总剂量辐射效应机理研究, 负责人, 国家任务, 2017-01--2020-12
( 2 ) 纳米级全耗尽高迁移率应变硅锗量子阱沟道器件研究, 负责人, 地方任务, 2012-10--2015-09
( 3 ) 高迁移率Si/SiGe/SOI 量子阱MOS器件载流子散射机理研究, 负责人, 国家任务, 2014-01--2016-12
( 4 ) 中国科学院“青年创新促进会”项目, 负责人, 中国科学院计划, 2014-01--2017-12
( 5 ) 16/14nm基础技术研究 绝缘体上III-V族化合物衬底材料制备技术研究, 参与, 中国科学院计划, 2013-01--2014-12
( 6 ) 面向超灵敏探测的异质集成研究, 负责人, 中国科学院计划, 2016-07--2021-06
( 7 ) 集成电路材料基因组关键技术研究与应用示范, 负责人, 地方任务, 2020-08--2022-07
( 8 ) 略, 负责人, 国家任务, 2022-01--2024-12
参与会议
(1)High Hole Mobility Si/SiGe/SOI Quantum-well Transistor   2015-10-24
(2)High Hole Mobility (s)Si/SiGe/(s)SOI Quantum Well p-MOSFETs   第八届中国功能材料及应用学术会议   2013-08-24
(3)Characteristics of higher-κ dielectric LaLuO3 with TiN as gate stack   2012-10-29
(4)Hole mobility enhancement of quantum-well p-MOSFETs on sSi/sSi0.5Ge0.5/sSOI heterostructure   2012-05-14
(5)High Mobility Si/Si0.5Ge0.5/strained SOI p-MOSFET with HfO2/TiN Gate Stack   2010-11-01

指导学生

已指导学生

王翼泽  硕士研究生  080903-微电子学与固体电子学  

刘晨鹤  博士研究生  080903-微电子学与固体电子学  

刘强  博士研究生  080903-微电子学与固体电子学  

陈玲丽  硕士研究生  080903-微电子学与固体电子学  

赵兰天  博士研究生  080903-微电子学与固体电子学  

朱宇波  硕士研究生  080903-微电子学与固体电子学  

现指导学生

魏涛  博士研究生  080903-微电子学与固体电子学  

周虹阳  硕士研究生  085400-电子信息  

姜文铮  硕士研究生  080903-微电子学与固体电子学  

林紫威  硕士研究生  080903-微电子学与固体电子学  

秦瑞东  博士研究生  080903-微电子学与固体电子学  

陈锦  硕士研究生  080903-微电子学与固体电子学  

刘语欣  博士研究生  080903-微电子学与固体电子学  

黄琪  博士研究生  080903-微电子学与固体电子学