基本信息
王鑫华  男  硕导  中国科学院微电子研究所
电子邮件: wangxinhua@ime.ac.cn
通信地址: 北京市朝阳区北土城西路3号
邮政编码:

研究领域

宽禁带半导体器件与异质集成


招生信息

招收有兴趣在宽禁带半导体、碳基半导体等领域开展器件、工艺、机理研究的研究生

招生专业
080903-微电子学与固体电子学
085400-电子信息
招生方向
宽禁带半导体器件与异质集成
碳基异质集成
宽禁带半导体表面界面科学

教育背景

2007-09--2012-07   中国科学院微电子研究所   研究生/工学博士
2003-09--2007-07   南京理工大学   本科/工学学士
学历

工作经历

   
工作简历
2022-09~现在, 中国科学院微电子研究所, 研究员,所党委委员,中心主任
2021-10~2022-09,中国科学院微电子研究所, 副研究员,所党委委员,中心主任
2020-12~2021-10,中国科学院微电子研究所, 副研究员,所党委委员,中心副主任,所团委副书记
2018-12~2020-12,中国科学院微电子研究所, 副研究员,中心副主任,所团委副书记
2017-05~2018-12,中国科学院微电子研究所, 副研究员,所团委副书记
2017-04~2017-05,中国科学院微电子研究所, 副研究员,所团委委员
2012-07~2017-04,中国科学院微电子研究所, 助理研究员,所团委委员

专利与奖励

2022年中国电子学会自然科学二等奖

2022年中国仪器仪表学会技术发明二等奖

奖励信息
(1) GaN基异质结功率器件表界面态机理与调控, 二等奖, 其他, 2022
(2) GaN电子器件低界面态介质技术与系统, 二等奖, 其他, 2022
专利成果
( 1 ) GaN基电子器件及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: 202011128395.5

( 2 ) 一种匹配氮化镓材料的低界面态复合介质结构及其制备方法, 发明专利, 2020, 第 1 作者, 专利号: 202010369832.6

( 3 ) GaN基功率晶体管结构及其制备方法, 发明专利, 2020, 第 2 作者, 专利号: 202010127104.4

( 4 ) 一种匹配(Al,In)GaN材料的超低界面态界面结构及其制备方法, 发明专利, 2018, 第 1 作者, 专利号: 201810593138.5

( 5 ) GAN-BASED POWER ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME, 发明专利, 2016, 第 3 作者, 专利号: US20170309736A1

( 6 ) Low Interface State Device and Method for Manufacturing the Same, 发明专利, 2015, 第 3 作者, 专利号: US10276366B2

出版信息

   
发表论文
[1] Kexin Deng, Xinhua Wang, Sen Huang, Pengfei Li, Qimeng Jiang, yin haibo, Jie Fan, Ke Wei, Yingkui Zheng, Jingyuan Shi, Xinyu Liu. Effective Suppression of Amorphous Ga2O and Related Deep Levels on GaN Surface by High-Temperature Remote Plasma Pretreatments in GaN-based Metal-Insulator-Semiconductor Electronic Devices. ACS Appl. Mater. Interfaces[J]. 2023, 15(20): 25058-25065, [2] 张洪泽, 田野, 孟莹, 母凤文, 王鑫华, 刘新宇. 表面活化室温键合技术研究进展. 机械工程学报[J]. 2022, 58(2): 136-146, http://lib.cqvip.com/Qikan/Article/Detail?id=7106919557.
[3] Guo, Fuqiang, Huang, Sen, Wang, Xinhua, Luan, Tiantian, Shi, Wen, Deng, Kexin, Fan, Jie, Yin, Haibo, Shi, Jingyuan, Mu, Fengwen, Wei, Ke, Liu, Xinyu. Suppression of interface states between nitride-based gate dielectrics and ultrathin-barrier AlGaN/GaN heterostructure with in situ remote plasma pretreatments. APPLIED PHYSICS LETTERS[J]. 2021, 118(9): https://www.webofscience.com/wos/woscc/full-record/WOS:000630475800001.
[4] Wang, Xinhua, Zhang, Yange, Huang, Sen, Yin, Haibo, Fan, Jie, Wei, Ke, Zheng, Yingkui, Wang, Wenwu, Jiang, Haojie, Wu, Xuebang, Wang, Xianping, Liu, Changsong, Liu, Xinyu. Partially Crystallized Ultrathin Interfaces between GaN and SiNx Grown by Low-Pressure Chemical Vapor Deposition and Interface Editing. ACS APPLIED MATERIALS & INTERFACES[J]. 2021, 13(6): 7725-7734, http://dx.doi.org/10.1021/acsami.0c19483.
[5] Zhang, Sheng, Liu, Xinyu, Wei, Ke, Huang, Sen, Chen, Xiaojuan, Zhang, Yichuan, Zheng, Yingkui, Liu, Guoguo, Yuan, Tingting, Wang, Xinhua, Yin, Haibo, Yao, Yao, Niu, Jiebin. Suppression of Gate Leakage Current in Ka-Band AlGaN/GaN HEMT With 5-nm SiN Gate Dielectric Grown by Plasma-Enhanced ALD. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2021, 68(1): 49-52, http://dx.doi.org/10.1109/TED.2020.3037888.
[6] Deng, Kexin, Wang, Xinhua, Huang, Sen, Yin, Haibo, Fan, Jie, Shi, Wen, Guo, Fuqiang, Wei, Ke, Zheng, Yingkui, Shi, Jingyuan, Jiang, Haojie, Wang, Wenwu, Liu, Xinyu. Suppression and characterization of interface states at low-pressure-chemical-vapor-deposited SiNx/III-nitride heterostructures. APPLIED SURFACE SCIENCE[J]. 2021, 542: http://dx.doi.org/10.1016/j.apsusc.2020.148530.
[7] Bi, Lan, Kang, Xuanwu, Wang, Xinhua, Yin, Haibo, Fan, Jie, Wei, Ke, Zheng, Yingkui, Huang, Sen, Liu, Xinyu. Monolithic Integrated Normally OFF GaN Power Device With Antiparallel Lateral Schottky Barrier Controlled Schottky Rectifier. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2021, 68(4): 1778-1783, http://dx.doi.org/10.1109/TED.2021.3058114.
[8] Huang, Sen, Wang, Xinhua, Liu, Xinyu, Li, Yuchen, Fan, Jie, Yin, Haibo, Wei, Ke, Zheng, Yingkui, Sun, Qian, Shen, Bo. Interface Charge Effects on 2-D Electron Gas in Vertical-Scaled Ultrathin-Barrier AlGaN/GaN Heterostructure. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2021, 68(1): 36-41, http://dx.doi.org/10.1109/TED.2020.3037272.
[9] Huang, Sen, Wang, Xinhua, Liu, Xinyu, Sun, Qian, Chen, Kevin J. An ultrathin-barrier AlGaN/GaN heterostructure: a recess-free technology for the fabrication and integration of GaN-based power devices and power-driven circuits. SEMICONDUCTOR SCIENCE AND TECHNOLOGY[J]. 2021, 36(4): http://dx.doi.org/10.1088/1361-6641/abd2fe.
[10] Zhao, Rui, Huang, Sen, Wang, Xinhua, Li, Yuchen, Shi, Jingyuan, Zhang, Yichuan, Fan, Jie, Yin, Haibo, Chen, Xiaojuan, Wei, Ke, Wu, Shan, Yang, Xuelin, Shen, Bo, Liu, Xinyu. Interface charge engineering in down-scaled AlGaN (< 6nm)/GaN heterostructure for fabrication of GaN-based power HEMTs and MIS-HEMTs. APPLIED PHYSICS LETTERS[J]. 2020, 116(10): https://www.webofscience.com/wos/woscc/full-record/WOS:000520479800001.
[11] Zhang, Yichuan, Huang, Sen, Wei, Ke, Zhang, Sheng, Wang, Xinhua, Zheng, Yingkui, Liu, Guoguo, Chen, Xiaojuan, Li, Yankui, Liu, Xinyu. Millimeter-Wave AlGaN/GaN HEMTs With 43.6% Power-Added-Efficiency at 40 GHz Fabricated by Atomic Layer Etching Gate Recess. IEEE ELECTRON DEVICE LETTERS[J]. 2020, 41(5): 701-704, https://www.webofscience.com/wos/woscc/full-record/WOS:000530387100012.
[12] Dang, Kui, Wei, Ke, Hao, Yue, Zhang, Jincheng, Zhou, Hong, Huang, Sen, Zhang, Tao, Bian, Zhaoke, Zhang, Yachao, Wang, Xinhua, Zhao, Shenglei. A 5.8-GHz High-Power and High-Efficiency Rectifier Circuit With Lateral GaN Schottky Diode for Wireless Power Transfer. IEEE TRANSACTIONS ON POWER ELECTRONICS[J]. 2020, 35(3): 2247-2252, http://dx.doi.org/10.1109/TPEL.2019.2938769.
[13] Wang Xinhua, Zhu Shengli, Jiao Binbin, Huang Sen, Wei Ke, Yin Haibo, Fan Jie, Liu Xinyu, IEEE. Room Temperature GaN-Si Bonding via an Intermediate Atomic-Layer-Deposition Al2O3 Layer by Using O Ion Beam. PROCEEDINGS OF 2019 6TH INTERNATIONAL WORKSHOP ON LOW TEMPERATURE BONDING FOR 3D INTEGRATION (LTB-3D)null. 2019, 13-13, http://apps.webofknowledge.com/CitedFullRecord.do?product=UA&colName=WOS&SID=5CCFccWmJJRAuMzNPjj&search_mode=CitedFullRecord&isickref=WOS:000492018300013.
[14] Huang Sen, Wang Xinhua, Liu Xinyu, Kang Xuanwu, Fan Jie, Yang Shuo, Yin Haibo, Wei Ke, Zheng Yingkui, Wang Xiaolei, Wang Wenwu, Shi Jingyuan, Gao Hongwei, Sun Qian, Chen Kevin J, IEEE. Revealing the Positive Bias Temperature Instability in Normally-OFF AlGaN/GaN MIS-HFETs by Constant-Capacitance DLTS. 2019 31ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD)null. 2019, 411-414, [15] Zhang, Sheng, Wei, Ke, Ma, XiaoHua, Hou, Bin, Liu, GuoGuo, Zhang, Yichuan, Wang, XinHua, Zheng, YingKui, Huang, Sen, Li, YanKui, Lei, TianMin, Liu, XinYu. Reduced reverse gate leakage current for GaN HEMTs with 3 nm Al/40 nm SiN passivation layer. APPLIED PHYSICS LETTERS[J]. 2019, 114(1): [16] Huang, Sen, Wang, Xinhua, Liu, Xinyu, Wang, Yuankun, Fan, Jie, Yang, Shuo, Yin, Haibo, Wei, Ke, Wang, Wenwu, Gao, Hongwei, Zhou, Yu, Sun, Qian, Chen, Kevin J. Monolithic integration of E/D-mode GaN MIS-HEMTs on ultrathin-barrier AlGaN/GaN heterostructure on Si substrates. APPLIED PHYSICS EXPRESS[J]. 2019, 12(2): [17] 康玄武, 郑英奎, 王鑫华, 黄森, 魏珂, 吴昊, 孙跃, 赵志波, 刘新宇. AlGaN/GaN异质结肖特基二极管研究进展. 电源学报[J]. 2019, 17(3): 44-52, http://lib.cqvip.com/Qikan/Article/Detail?id=7002181403.
[18] Liu, Chunyu, Wang, Xinhua, Huang, Sen, Ma, Xiaohua, Wang, Yuankun, Zhang, Sheng, Zhao, Rui, Shi, Wen, He, Quanbo, Yin, Haibo, Fan, Jie, Luo, Weijun, Wei, Ke, Liu, Xinyu. A large-signal Pspice modeling of GaN-based MIS-HEMTs. SUPERLATTICES AND MICROSTRUCTURES[J]. 2019, 130: 499-511, http://dx.doi.org/10.1016/j.spmi.2019.05.023.
[19] Huang, Sen, Wang, Xinhua, Liu, Xinyu, Zhao, Rui, Shi, Wen, Zhang, Yichuan, Fan, Jie, Yin, Haibo, Wei, Ke, Zheng, Yingkui, Shi, Jingyuan, Wang, Xiaolei, Wang, Wenwu, Sun, Qian, Chen, Kevin J. Capture and emission mechanisms of defect states at interface between nitride semiconductor and gate oxides in GaN-based metal-oxide-semiconductor power transistors. JOURNAL OF APPLIED PHYSICS[J]. 2019, 126(16): [20] Zhang, Jinhan, Kang, Xuanwu, Wang, Xinhua, Huang, Sen, Chen, Chen, Wei, Ke, Zheng, Yingkui, Zhou, Qi, Chen, Wanjun, Zhang, Bo, Liu, Xinyu. Ultralow-Contact-Resistance Au-Free Ohmic Contacts With Low Annealing Temperature on AlGaN/GaN Heterostructures. IEEE ELECTRON DEVICE LETTERS[J]. 2018, 39(6): 847-850, https://www.webofscience.com/wos/woscc/full-record/WOS:000437086800016.
[21] Kang Xuanwu, Wang Xinhua, Huang Sen, Zhang Jinhan, Fan Jie, Yang Shuo, Wang Yuankun, Zheng Yingkui, Wei Ke, Zhi Jin, Liu Xinyu, IEEE. Recess-Free AlGaN/GaN Lateral Schottky Barrier Controlled Schottky Rectifier with Low Turn-on Voltage and High Reverse Blocking. PRODCEEDINGS OF THE 2018 IEEE 30TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD)null. 2018, 280-283, [22] Huang, Sen, Liu, Xinyu, Wang, Xinhua, Kang, Xuanwu, Zhang, Jinhan, Fan, Jie, Shi, Jingyuan, Wei, Ke, Zheng, Yingkui, Gao, Hongwei, Sun, Qian, Wang, Maojun, Shen, Bo, Chen, Kevin J. Ultrathin-Barrier AlGaN/GaN Heterostructure: A Recess-Free Technology for Manufacturing High-Performance GaN-on-Si Power Devices. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2018, 65(1): 207-214, https://www.webofscience.com/wos/woscc/full-record/WOS:000418753200030.
[23] Liu, Xinyu, Wang, Xinhua, Zhang, Yange, Wei, Ke, Zheng, Yingkui, Kang, Xuanwu, Jiang, Haojie, Li, Junfeng, Wang, Wenwu, Wu, Xuebang, Wang, Xianping, Huang, Sen. Insight into the Near-Conduction Band States at the Crystallized Interface between GaN and SiNx Grown by Low-Pressure Chemical Vapor Deposition. ACS APPLIED MATERIALS & INTERFACES[J]. 2018, 10(25): 21721-21729, http://dx.doi.org/10.1021/acsami.8b04694.
[24] Zhang, Yichuan, Wei, Ke, Huang, Sen, Wang, Xinhua, Zheng, Yingkui, Liu, Guoguo, Chen, Xiaojuan, Li, Yankui, Liu, Xinyu. High-Temperature-Recessed Millimeter-Wave AlGaN/GaN HEMTs With 42.8% Power-Added-Efficiency at 35 GHz. IEEE ELECTRON DEVICE LETTERS[J]. 2018, 39(5): 727-730, https://www.webofscience.com/wos/woscc/full-record/WOS:000432990700021.
[25] Liu, Xinyu, Huang, Sen, Bao, Qilong, Wang, Xinhua, Wei, Ke, Li, Yankui, Xiang, Jinjuan, Zhao, Chao, Yang, Xuelin, Shen, Bo, Guo, Shiping. Evolution of traps in TiN/O-3-sourced Al2O3/GaN gate structures with thermal annealing temperature. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B[J]. 2018, 36(2): [26] 黄森, 魏珂, 章晋汉, 康玄武, 王鑫华. Investigation of current collapse mechanism of LPCVD Si3N4 passivated AlGaN/GaN HEMTs by fast soft-switched current-DLTS and CC-DLTFS. Power Semiconductor Devices and IC's (ISPSD)null. 2017, http://159.226.55.106/handle/172511/18240.
[27] 魏珂, 刘果果, 陈晓娟, 王鑫华, 黄森. N2 plasma treatment for gate leakage reduction in AlGaN/GaN HEMT. 12th International Conference on Nitride Semiconductorsnull. 2017, http://159.226.55.106/handle/172511/18243.
[28] 郑英奎, 魏珂, 樊捷, 袁婷婷, 刘果果, 陈晓娟, 黄森, 王鑫华. 基于BCl3/Cl2/Ar气体的ICP刻蚀技术对于GaN HEMT器件肖特基性能的改进. 第二届全国宽禁带半导体学术会议null. 2017, http://159.226.55.106/handle/172511/18246.
[29] 王鑫华, 黄森, 康玄武, 刘新宇. 绝缘栅GaN基平面功率开关器件技术. 电力电子技术[J]. 2017, 51(8): 65-70, http://lib.cqvip.com/Qikan/Article/Detail?id=673010498.
[30] Huang Sen, Yang Shu, Tang Zhikai, Hua Mengyuan, Wang Xinhua, Wei Ke, Bao Qilong, Liu Xinyu, Chen Jing. Device physics towards high performance GaN-based power electronics. SCIENTIA SINICA PHYSICA, MECHANICA & ASTRONOMICA[J]. 2016, 46(10): 107307-1, http://159.226.55.106/handle/172511/16129.
[31] Huang, Sen, Liu, Xinyu, Wang, Xinhua, Kang, Xuanwu, Zhang, Jinhan, Bao, Qilong, Wei, Ke, Zheng, Yingkui, Zhao, Chao, Gao, Hongwei, Sun, Qian, Zhang, Zhaofu, Chen, Kevin J. High Uniformity Normally-OFF GaN MIS-HEMTs Fabricated on Ultra-Thin-Barrier AlGaN/GaN Heterostructure. IEEE ELECTRON DEVICE LETTERS[J]. 2016, 37(12): 1617-1620, http://www.irgrid.ac.cn/handle/1471x/1175215.
[32] 黄森, 王鑫华. Device physics towards high performance GaN-based power electronics. SCIENTIA SINICA PHYSICA, MECHANICA & ASTRONOMICA[J]. 2016, 46(10): 107307-1, http://159.226.55.106/handle/172511/16129.
[33] Bao, Qilong, Huang, Sen, Wang, Xinhua, Wei, Ke, Zheng, Yingkui, Li, Yankui, Yang, Chengyue, Jiang, Haojie, Li, Junfeng, Hu, Anqi, Yang, Xuelin, Shen, Bo, Liu, Xinyu, Zhao, Chao. Effect of interface and bulk traps on the C-V characterization of a LPCVD-SiNx/AlGaN/GaN metal-insulator-semiconductor structure. SEMICONDUCTOR SCIENCE AND TECHNOLOGY[J]. 2016, 31(6): http://159.226.55.106/handle/172511/16130.
[34] Liu, Zhaoyang, Huang, Sen, Bao, Qilong, Wang, Xinhua, Wei, Ke, Jiang, Haojie, Cui, Hushan, Li, Junfeng, Zhao, Chao, Liu, Xinyu, Zhang, Jinhan, Zhou, Qi, Chen, Wanjun, Zhang, Bo, Jia, Lifang. Investigation of the interface between LPCVD-SiNx gate dielectric and III-nitride for AlGaN/GaN MIS-HEMTs. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B[J]. 2016, 34(4): http://159.226.55.106/handle/172511/16131.
[35] Shi, Yijun, Huang, Sen, Bao, Qilong, Wang, Xinhua, Wei, Ke, Jiang, Haojie, Li, Junfeng, Zhao, Chao, Li, Shuiming, Zhou, Yu, Gao, Hongwei, Sun, Qian, Yang, Hui, Zhang, Jinhan, Chen, Wanjun, Zhou, Qi, Zhang, Bo, Liu, Xinyu. Normally OFF GaN-on-Si MIS-HEMTs Fabricated With LPCVD-SiNx Passivation and High-Temperature Gate Recess. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2016, 63(2): 614-619, http://www.irgrid.ac.cn/handle/1471x/1175212.
[36] Ma, Xiaohua, Liu, Ying, Wang, Xinhua, Huang, Sen, Gao, Zhu, Bao, Qilong, Liu, Xinyu. Effect of alloying temperature on the capacitance-voltage and current-voltage characteristics of low-pressure chemical vapor deposition SiNx/n-GaN MIS structures. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE[J]. 2015, 212(12): 2928-2935, https://www.webofscience.com/wos/woscc/full-record/WOS:000366589900040.
[37] Ma XiaoHua, Zhang YaMan, Wang XinHua, Yuan TingTing, Pang Lei, Chen WeiWei, Liu XinYu. Breakdown mechanisms in AlGaN/GaN high electron mobility transistors with different GaN channel thickness values. CHINESE PHYSICS B[J]. 2015, 24(2): https://www.webofscience.com/wos/woscc/full-record/WOS:000350829700060.
[38] Zhang Sheng, Wei Ke, Yu Le, Liu GuoGuo, Huang Sen, Wang XinHua, Pang Lei, Zheng YingKui, Li YanKui, Ma XiaoHua, Sun Bing, Liu XinYu. AlGaN/GaN high electron mobility transistor with Al2O3+BCB passivation. CHINESE PHYSICS B[J]. 2015, 24(11): http://159.226.55.106/handle/172511/16067.
[39] Zhang, Jinhan, Huang, Sen, Bao, Qilong, Wang, Xinhua, Wei, Ke, Zheng, Yingkui, Li, Yankui, Zhao, Chao, Liu, Xinyu, Zhou, Qi, Chen, Wanjun, Zhang, Bo. Mechanism of Ti/Al/Ti/W Au-free ohmic contacts to AlGaN/GaN heterostructures via pre-ohmic recess etching and low temperature annealing. APPLIED PHYSICS LETTERS[J]. 2015, 107(26): [40] Wang, Xinhua, Huang, Sen, Zheng, Yingkui, Wei, Ke, Chen, Xiaojuan, Liu, Guoguo, Yuan, Tingting, Luo, Weijun, Pang, Lei, Jiang, Haojie, Li, Junfeng, Zhao, Chao, Zhang, Haoxiang, Liu, Xinyu. Robust SiNx/AlGaN Interface in GaN HEMTs Passivated by Thick LPCVD-Grown SiNx Layer. IEEE ELECTRON DEVICE LETTERS[J]. 2015, 36(7): 666-668, http://www.irgrid.ac.cn/handle/1471x/1089137.
[41] Huang, Sen, Liu, Xinyu, Zhang, Jinhan, Wei, Ke, Liu, Guoguo, Wang, Xinhua, Zheng, Yingkui, Liu, Honggang, Jin, Zhi, Zhao, Chao, Liu, Cheng, Liu, Shenghou, Yang, Shu, Zhang, Jincheng, Hao, Yue, Chen, Kevin J. High RF Performance Enhancement-Mode Al2O3/AlGaN/GaN MIS-HEMTs Fabricated With High-Temperature Gate-Recess Technique. IEEE ELECTRON DEVICE LETTERS[J]. 2015, 36(8): 754-756, http://10.10.10.126/handle/311049/14969.
[42] Huang, Sen, Liu, Xinyu, Wei, Ke, Liu, Guoguo, Wang, Xinhua, Sun, Bing, Yang, Xuelin, Shen, Bo, Liu, Cheng, Liu, Shenghou, Hua, Mengyuan, Yang, Shu, Chen, Kevin J. O-3-sourced atomic layer deposition of high quality Al2O3 gate dielectric for normally-off GaN metal-insulator-semiconductor high-electron-mobility transistors. APPLIED PHYSICS LETTERS[J]. 2015, 106(3): http://www.irgrid.ac.cn/handle/1471x/1089122.
[43] 林体元, 庞磊, 王鑫华, 黄森, 刘果果, 袁婷婷, 刘新宇. Optimized power simulation of AlGaN/GaN HEMT for continuous wave and pulse applications. JOURNAL OF SEMICONDUCTORS[J]. 2015, 36(7): 074006-01, http://10.10.10.126/handle/311049/14935.
[44] Huang, Sen, Wei, Ke, Liu, Guoguo, Zheng, Yingkui, Wang, Xinhua, Pang, Lei, Kong, Xin, Liu, Xinyu, Tang, Zhikai, Yang, Shu, Jiang, Qimeng, Chen, Kevin J. High-f(MAX) High Johnson's Figure-of-Merit 0.2-mu m Gate AlGaN/GaN HEMTs on Silicon Substrate With AlN/SiNx Passivation. IEEE ELECTRON DEVICE LETTERS[J]. 2014, 35(3): 315-317, https://www.webofscience.com/wos/woscc/full-record/WOS:000332029200008.
[45] Wang, Xinhua, Huang, Sen, Zheng, Yingkui, Wei, Ke, Chen, Xiaojuan, Zhang, Haoxiang, Liu, Xinyu. Effect of GaN Channel Layer Thickness on DC and RF Performance of GaN HEMTs With Composite AlGaN/GaN Buffer. IEEE TRANSACTIONS ON ELECTRON DEVICES[J]. 2014, 61(5): 1341-1346, http://10.10.10.126/handle/311049/12532.
[46] Ma XiaoHua, Jiang YuanQi, Wang XinHua, Lu Min, Zhang Huo, Chen WeiWei, Liu XinYu. Time-dependent degradation of threshold voltage in AlGaN/GaN high electron mobility transistors. CHINESE PHYSICS B[J]. 2014, 23(1): https://www.webofscience.com/wos/woscc/full-record/WOS:000331805400063.
[47] 刘新宇, 王鑫华, 黄森, 罗卫军, 苏永波, 姚鸿飞. InP基/GaN基器件与电路在微波毫米波领域“大显身手”. 科学中国人[J]. 2014, 33-36, http://lib.cqvip.com/Qikan/Article/Detail?id=662729944.
[48] Wang Xinhua, Jiang Yuanqi, Huang Sen, Zheng Yingkui, Wei Ke, Chen Xiaojuan, Luo Weijun, IEEE. Electric Field Dependent Drain Current Drift of AlGaN/GaN HEMT. 2013 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT (IRW)null. 2013, 125-128, [49] 王鑫华, 王建辉, 庞磊, 陈晓娟, 袁婷婷, 罗卫军, 刘新宇. GaN MMIC中SiN介质MIM电容的可靠性. 物理学报[J]. 2012, 61(17): 177302-1, http://lib.cqvip.com/Qikan/Article/Detail?id=43137745.
[50] 王建辉, 王鑫华, 庞磊, 陈晓娟, 刘新宇. Modeling, Simulation and Analysis of Thermal Resistance in Multi-finger AlGaN/GaN HEMTs on SiC Substrates. CHINESE PHYSICS LETTERS[J]. 2012, 29(8): 279-283, https://www.webofscience.com/wos/woscc/full-record/WOS:000307667100074.
[51] 王建辉, 王鑫华, 庞磊, 陈晓娟, 金智, 刘新宇. Effect of varying layouts on the gate temperature for multi-finger AIGaN/GaN HEMTs. 半导体学报[J]. 2012, 33(9): 60-64, http://lib.cqvip.com/Qikan/Article/Detail?id=43279972.
[52] Wang Jianhui, Wang Xinhua, Pang Lei, Chen Xiaojuan, Jin Zhi, Liu Xinyu. Effect of varying layouts on the gate temperature for multi-finger A1GaN/GaN HEMTs. JOURNAL OF SEMICONDUCTORS[J]. 2012, 33(9): 094004-1, http://sciencechina.cn/gw.jsp?action=detail.jsp&internal_id=4701958&detailType=1.
[53] Wang XinHua, Wang JianHui, Pang Lei, Chen XiaoJuan, Yuan TingTing, Luo WeiJun, Liu XinYu. Reliability of SiN-based MIM capacitors in GaN MMIC. ACTA PHYSICA SINICA[J]. 2012, 61(17): http://dx.doi.org/10.7498/aps.61.177302.
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科研活动

   
科研项目
( 1 ) 新型GaN电子器件低界面态介质生长系统, 负责人, 国家任务, 2016-01--2021-12
( 2 ) 宽频段全数字发信机设计理论与关键技术, 负责人, 国家任务, 2017-01--2021-12
( 3 ) 中国科学院青年创新促进会会员项目, 负责人, 中国科学院计划, 2018-01--2021-12
( 4 ) 氮化镓集成元件与高功率技术开发, 负责人, 企业委托, 2021-01--2023-12
( 5 ) 新型高阈值电压GaN电力电子器件模型与关键技术研究, 参与, 国家任务, 2021-01--2024-12
( 6 ) 高质量表面重构技术, 负责人, 国家任务, 2022-11--2027-12

指导学生

现指导学生

李鑫杰  硕士研究生  085403-集成电路工程  

邢湘杰  硕士研究生  080903-微电子学与固体电子学  

李红月  硕士研究生  085400-电子信息  

雷依培  硕士研究生  080903-微电子学与固体电子学  

郭宇浩  硕士研究生  085400-电子信息