Dr Rong Su is a senior research scientist at Shanghai Institute of Optics and Fine Mechanics. He obtained his MSc in Photonics (2009) and PhD in Optical Metrology (2014) from KTH Royal Institute of Technology in Sweden. Between 2015 and 2021 he worked at the National Physical Laboratory and University of Nottingham in the UK. He has published 60+ peer-reviewed journal and conference papers and two book chapters on surface metrology, interferometric imaging, light scattering, micro-scale defect detection and optical modelling, and has had ten-year research and managing experience in EU and UK projects. His research outcomes have been adopted by world-leading optical instrument manufacturers. In 2021, he is awarded a Young-Talent Fellowship from the Chinese Academy of Sciences, and secured multi-million funding for research. He is also an editor of Light: Advanced Manufacturing and Nanomanufacturing and Metrology, a member of SPIE and IOP, a program committee member of SPIE-Photonics Europe and European Optical Society Annual meeting, a member of the National Professional Standardization Committee, and a former Research Affiliate of CIRP.

Research Areas

Coherence scanning interferometry, phase shifting interferometry, interference/holographic microscopy, scattering instrument

Fourier optics, computational imaging, optical modelling, AI in optical metrology

Micro/nano metrology, surface metrology, wavefront metrology

Optomechanical design, precision instrumentation, virtual optical instrument


1        P. de Groot, L. L. Deck, R. Su, W. Osten. Contributions of holography to the advancement of interferometric measurements of surface topography. Light: Advanced Manufacturing, under review.

2        P. de Groot, X. Colonna de Lega, R. Su, J. M. Coupland, R. K. Leach. Modeling of coherence scanning interferometry using classical Fourier optics. Optical Engineering 6 104106 (2021).

3        M. Thomas, R. Su*, P. de Groot, J. M. Coupland, R. K. Leach. Surface measuring coherence scanning interferometry beyond the specular reflection limit. Optics Express 29 36121-36131 (2021).

4        S. Shabbir, S. Garvey, S. Dakka, B. Rothwell, R. Su, R. K. Leach, N. Weston. Analysis of the tribological interaction of a polytetrafluoroethylene-lined radial lip oil seal, shaft and lubricant sample. Journal of Engineering Tribology, March (2021).

5        R. Su*, R. K. Leach. Physics-based virtual coherence scanning interferometer for surface measurement. Light: Advanced Manufacturing 2 article 9 (2021).

6        Y. Arezki, R. Su, V. Heikkinen, F. Leprete, P. Posta, Y. Bitou, C. Schober, C. Mehdi-Souzani, B. A. M. Alzahrani, X. Zhang, Y. Kondo, C. Pruss, V. Ledl, N. Anwer, M. L. Bouazizi, R. K. Leach, H. Nouira. Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level. Sensors 21 1103 (2021).

7        R. Su*, J. M. Coupland, C. J. R. Sheppard, R. K. Leach. Scattering and three-dimensional imaging in surface topography measuring interference microscopy. Journal of the Optical Society of America A 38 A27-A42 (2021).

8        D. Mabwa, T. Kubiena, H. Parnell, R. Su, D. Furniss, Z. Tang, R. K. Leach, T. M. Benson, C. A. Scotchford, A. B. Seddon. Evaluating the cytotoxicity of Ge-Sb-Se chalcogenide glass optical fibres on 3T3 mouse fibroblasts. RSC Advances 11 8682-8693 (2021).

9        R. Su. Coherence scanning interferometry. In: R. K. Leach ed., Advances in Optical Surface Texture Metrology (IOP Publishing 2020).

10     N. Flay, S. Brown, W. Sun, T. Blumensath, R. Su. Effects of off-focal radiation on dimensional measurements in industrial cone-beam micro-focus X-ray computed tomography systems. Precision Engineering 66 472-481 (2020).

11     C. Gomez, C. Campanelli, R. Su, R. K. Leach. Surface-process correlation for an ink-jet printed transparent fluoroplastic. Surface Topography: Metrology and Properties 8 034002 (2020).

12     R. Leach, H. Haitjema, R. Su, A. Thompson. Metrological characteristics for the calibration of surface topography measuring instruments: a review. Measurement Science and Technology, 32 032001 (2020).

13     M. Liu, C. Cheung, N. Senin, S. Wang, R. Su, R. K. Leach. On-machine surface defect detection using light scattering and deep learning. Journal of the Optical Society of America A 37 B53-B59 (2020).

14     I. Zorin, R. Su, B. Heise, B. Lendl, M. Brandstetter. Correlative infrared optical coherence tomography and hyperspectral chemical imaging. Journal of the Optical Society of America A 37 B19-B26 (2020).

15     M. Thomas, R. Su*, N. Nikolaev, J. M. Coupland, R. K. Leach. Modelling of interference microscopy beyond the linear regime. Optical Engineering, 59 034110 (2020).

16     C. Gomez, R. Su*, P. de Groot, R. K. Leach. Noise reduction in coherence scanning interferometry for surface topography measurement. Nanomanufacturing and Metrology, 3 68-76 (2020).

17     R. Su*, M. Thomas, M. Liu, S. Benketaf, J. Drs, Y. Bellouard, C. Pruss, J. M. Coupland, R. K. Leach. Lens aberration compensation in interference microscopy. Optics and Lasers in Engineering 128 106015 (2020).

18     X. Feng, N. Senin, R. Su, S. Ramasamy, R. K. Leach. Optical measurement of surface topographies with transparent coatings. Optics and Lasers in Engineering 121 261-270 (2019).

19     G. Maculotti, X. Feng, R. Su, M. Galetto, R. K. Leach. Residual flatness and scale calibration for a point autofocus surface topography measuring instrument. Measurement Science and Technology 30 075005 (2019).

20     J. Wang, R. Su, R. K. Leach, W. Lu, L. Zhou, X. Jiang. Resolution enhancement for topography measurement of high-dynamic-range surfaces via image fusion. Optics Express 26(26) 34805-34819 (2018).

21     I. Zorin, R. Su, A. Prylepa, J. Kilgus, M. Brandstetter, B. Heise. Mid-infrared Fourier-domain optical coherence tomography with a pyroelectric linear array. Optics Express 26(25) 33428-33439 (2018).

22     A. Speidel, R. Su, J. Mitchell-Smith, P. Dryburgh, I. Bisterov, D. Pieris, W. Li, M. Clark, A. T. Clare. Crystallographic texture can be rapidly determined by electrochemical surface analytics. Acta Materialia 159 89-101 (2018).

23     X. Feng, R. Su*, T. Happonen, J. Liu, R. K. Leach. Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing. Optics Express 26(11) 13927-13937 (2018). (Co-first author)

24     R. K. Leach, D. Sims-Waterhouse, F. Medeossi, E. Savio, S. Carmignato, R. Su. Fusion of photogrammetry and coherence scanning interferometry data for all-optical coordinate measurement. CIRP Annals Manufacturing Technology, 67(1) 599-602 (2018).

25     R. Su*, M. Thomas, J. M. Coupland, R. K. Leach. Effects of defocus on transfer function of coherence scanning interferometry. Optics Letters 43(1) 82-85 (2018).

26     P. Ekberg, R. Su*, R. K. Leach. High-precision lateral distortion measurement and correction in coherence scanning interferometry using an arbitrary surface. Optics Express 25(16) 18703-18712 (2017).

27     C. Gomez, R. Su*, A. Thompson, J. DiSciacca, S. Lawes, R. Leach. Optimisation of surface measurement for metal additive manufacturing using coherence scanning interferometry. Optical Engineering 56(11) 111714 (2017).

28     M. Liu, C. Cheung, C. Cheng, R. Su, R. K. Leach. A Gaussian process and image registration based stitching method for high dynamic range measurement of precision surfaces. Precision Engineering 50 99-106 (2017).

29     R. Su*, Y. Wang, J. M. Coupland, R. K. Leach. On tilt and curvature dependent errors and the calibration of coherence scanning interferometry. Optics Express 25(4) 3297-3310 (2017).

30     R. Su*, M. Kirillin, E. W. Chang, E. Sergeeva, S. H Yun, L. Mattsson. Perspectives of mid-infrared optical coherence tomography for inspection and micrometrology of industrial ceramics. Optics Express 22 15804-15819 (2014).

31     R. Su*, P. Ekberg, M. Leitner, L. Mattsson. Accurate and automated image segmentation of 3D optical coherence tomography data suffering from low signal-to-noise levels. Journal of the Optical Society of America A 31(12) 2551-2560 (2014).

32     P. Ekberg, R. Su*, E. W. Chang, S. H. Yun, L. Mattsson. Fast and accurate metrology of multi-layered ceramic materials by an automated boundary detection algorithm developed for optical coherence tomography data. Journal of the Optical Society of America A 31 217-226 (2014).

33     Y. Li, R. Su, M. Hedlind, P. Ekberg, T. Kjellberg, L. Mattsson. Model based in-process monitoring with optical coherence tomography. Procedia CIRP 2 70-73 (2012).

34     R. Su*, M. Kirillin, P. Ekberg, A. Roos, E. Sergeeva, L. Mattsson. Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic. Optics Express 20 4603-4618 (2012). 


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